Bragg’s law describes the condition for an X-ray reflection (i.e., constructive interference) for crystalline materials and is given as n λ = 2 d sinθ, where n is the path difference between reflecting planes, which must be an integer for constructive interference, λ is the wavelength, d is the interplanar spacing, and θ is the glancing angle of incidence (reflection angle). In an X-ray diffraction experiment, the λ is known and is dependent on the X-ray source in use,θ is the measured quantity, and d is the parameter that is characteristic of the material under study. Thus, both n and d are unknowns. In practice, the order of the reflection n is fixed for the value of d for a specific plane hkl (and thus is included in the value) and, the use of d_hkl symbolizes this inter-relationship. Thus, the modified version of the Bragg equation is used in practice, which is given as: λ = 2 d_hkl sinθ.